Physical Sciences › Génie / Ingénierie › Mécanique computationnelle › Interactions ion-surface et analyse

Interactions ion-surface et analyse

This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.

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